10:30 AM-12:30 PM
Law School, Room 180
Metrology is measurement science. Coordinate metrology is a discipline of dimensional metrology used in many technical and scientific processes. It is the key for maintaining and improving the quality in manufacturing. In computer-aided inspection a part is measured by a coordinate measuring system yielding a set of data points. The problem then is to find a best-fit geometric element to the data set, i.e., to determine the geometric and position/orientation parameters of the part. Least-squares fits are often used for the purpose of minimizing the geometric distances of the fitted element from the measured points. Mathematical tools and software support in metrology are still to be developed and improved. Some of the methods used are orthogonal distance progression, total least squares, implicit least squares, and Chebychev fits. This minisymposium will focus on some best-fit and related problems in metrology.
Organizer: Walter Gander
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