SIAM Journal on Imaging Sciences

Editorial Board

Editorial Board


Gabriele Steidl
Technische Universität Berlin

Associate Editors

Habib Ammari
ETH Zurich
Simon R. Arridge
University College London
Jean-Francois Aujol
Universite Bordeaux I
Richard G. Baraniuk
Rice University
Mirela Ben-Chen
Technion - Israel Institute of Technology
Thierry Blu
The Chinese University of Hong Kong
Charles A. Bouman
Purdue University
David J. Brady
University of Arizona
Xavier Bresson
Nanyang Technological University
Alexander Bronstein
Technion - Israel Institute of Technology
Michael M. Bronstein
Universita Della Svizzera Italiana
Martin Burger
Friedrich-Alexander Universitat
Mujdat Cetin
University of Rochester
Emilie Chouzenoux
Inria Saclay
Patrick L. Combettes
North Carolina State University
Christine de Mol
Universite Libre de Bruxelles
Julie Delon
Universite de Paris
Weisheng Dong
Xidian University
Michael Elad
Technion - Israel Institute of Technology
Adel Faridani
Oregon State University
Jeff Fessler
University of Michigan
Vivek K. Goyal
Boston University
Markus Haltmeier
University of Innsbruck
Anders C. Hansen
University of Cambridge
Vladlen Koltun
Intel Corporation
Peter Kuchment
Texas A&M University
Gitta Kutyniok
University of Munich
Tomer Michaeli
Technion - Israel Institute of Technology
Deanna Needell
University of California, Los Angeles
Michael Ng
The University of Hong Kong
Ozan Öktem
Kth Royal Institute of Technology
Gabriel Peyré
École Normale Supérieure
Phil Schniter
Ohio State University
Christoph Schnoerr
University of Heidelberg
Carola-Bibiane Schoenlieb
DAMTP, University of Cambridge
Ivan W. Selesnick
New York University
Thomas Strohmer
University of California, Davis
Xue Cheng Tai
Hong Kong Baptist University
Radu Timofte
ETH Zurich
Martin Uecker
Technische Universitaet Graz
Dimitri Van De Ville
Ecole Polytechnique Federale De Lausanne
Joachim Weickert
Saarland University
Lei Zhang
Hong Kong Polytechnic University
Hongkai Zhao
Duke University

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